Brain injury - a global problem
Brain injuries are the leading cause of death and disability worldwide. Patients with an Acquired Brain Injury (ABI) or Traumatic Brain Injury (TBI) often develop a secondary brain injury.
The major cause of secondary brain injury is Brain Hypoxia. Brain cells die within minutes if deprived of sufficient oxygen.
When brain hypoxia is detected, treatments to maintain adequate brain oxygen levels and prevent secondary brain are straightforward and effective.
Evidence confirms that with early detection and treatment of brain hypoxia, patient outcomes are improved, and the risk of long-term disability and death are reduced.
Clinical guidelines recommend brain oxygen monitoring. Existing brain oxygen monitoring techniques fail to reliably detect and report brain hypoxia in patients with acquired and traumatic brain injury. Consequently, treatment of brain hypoxia is delayed, often resulting in permanent disability or death for the patient.
Limitations of current brain monitoring
Probes – ICP| PbtO2 [Invasive]
Surgery to drill a hole in the skull and insert a probe into the brain
10% risk of further brain injury due to bleeding and a 3% risk of brain infection5
Only measures from one location
Error rate in reporting +/- 13% (PbtO2)
Every probe requires calibration
2 hours post insertion before data can be accessed
Maximum monitoring duration is only 5 days
ICP monitors report hourly when used with drain
Cost of monitoring per patient
Cost of surgery
Physical examination [Non-invasive]
Assessment does not measure brain oxygen
Adverse events detected after Brain Hypoxia has occurred
Assessment is not continuous (hourly)
Assessment is subjective